Tian, Y., Jiang, H., Laiho, P., & Kauppinen, E. (2018). On the Validity of Measuring Metallic and Semiconducting SWCNT Fractions by Quantitative Raman Spectroscopy. Analytical Chemistry. https://doi.org/10.1021/acs.analchem.7b03712 (Original work published 2018)
